Characterisation of materials through x-ray mapping

Intsitute of Materials Engineering Australiasia
Publication Type:
Journal Article
Materials Forum, 2006, 30 pp. 63 - 70
Issue Date:
Full metadata record
Scanning electron microscopy (SEM) energy dispersive spectroscopy (EDS, wavelength dispersive spectroscopy (WDS) and the conbination of these techniques through x-ray mapping (XRM) have become excellent tool for characterising the distribution of elements and phases in materials. Quantitative x-ray mapping (QXRM) enables reliable quantitative results that cna be an order of magnitude better than traditional analysis and is also far superior to regions of interest x-ray maps(ROIM) where low levels of an element overlaps are present.
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