Characterisation of materials through x-ray mapping

Wuhrer, R; Moran, K; Moran, L

Characterisation of materials through x-ray mapping

Wuhrer, R Moran, K Moran, L

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Publisher:: Intsitute of Materials Engineering Australiasia
Publication Type:: Journal Article
Citation:: Materials Forum, 2006, 30 pp. 63 - 70
Issue Date:: 2006-01

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Field	Value	Language
dc.contributor.author	Wuhrer, R	en_US
dc.contributor.author	Moran, K	en_US
dc.contributor.author	Moran, L	en_US
dc.date.issued	2006-01	en_US
dc.identifier.citation	Materials Forum, 2006, 30 pp. 63 - 70	en_US
dc.identifier.issn	1447-6738	en_US
dc.identifier.uri	http://hdl.handle.net/10453/5684
dc.description.abstract	Scanning electron microscopy (SEM) energy dispersive spectroscopy (EDS, wavelength dispersive spectroscopy (WDS) and the conbination of these techniques through x-ray mapping (XRM) have become excellent tool for characterising the distribution of elements and phases in materials. Quantitative x-ray mapping (QXRM) enables reliable quantitative results that cna be an order of magnitude better than traditional analysis and is also far superior to regions of interest x-ray maps(ROIM) where low levels of an element overlaps are present.	en_US
dc.publisher	Intsitute of Materials Engineering Australiasia	en_US
dc.relation.ispartof	Materials Forum	en_US
dc.title	Characterisation of materials through x-ray mapping	en_US
dc.type	Journal Article
utslib.citation.volume	30	en_US
utslib.for	0299 Other Physical Sciences	en_US
utslib.for	1007 Nanotechnology	en_US
utslib.for	0912 Materials Engineering	en_US
dc.location.activity	UTS Gallery, Sydney
pubs.embargo.period	Not known	en_US
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Science
utslib.copyright.status	open_access
pubs.consider-herdc	true	en_US
pubs.volume	30	en_US

Abstract:

Scanning electron microscopy (SEM) energy dispersive spectroscopy (EDS, wavelength dispersive spectroscopy (WDS) and the conbination of these techniques through x-ray mapping (XRM) have become excellent tool for characterising the distribution of elements and phases in materials. Quantitative x-ray mapping (QXRM) enables reliable quantitative results that cna be an order of magnitude better than traditional analysis and is also far superior to regions of interest x-ray maps(ROIM) where low levels of an element overlaps are present.

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http://hdl.handle.net/10453/5684