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Showing results 2 to 8 of 8
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Issue Date
Title
Author(s)
2006-01
Bayesian analysis of band-broadening models used in high performance liquid chromatography
Armstrong, NG
2005-01
Bayesian analysis of ceria nanoparticles from line profile data
Armstrong, NG
;
Dowd, AR
;
Cline, JP
;
Kalceff, W
;
Huang, TC
2004-01
A Bayesian/Maximum Entropy Method for Certification of a Nanocrystalline-Size NIST Reference Material
Armstrong, NG
;
Kalceff, W
;
Cline, JP
;
Bonevich, JE
;
Mittemeijer, EJ
;
Scardi, P
2005-01
Characterisation of atomic layer deposition using x-ray reflectometry
Windover, D
;
Armstrong, NG
;
Cline, JP
;
Hung, PY
;
Diebold, A
;
Seiler, DG
;
Diebold, AC
;
McDonald, R
;
Ayre, CR
;
Khosla, RP
;
Zollner, S
;
Secula, EM
2006-01
Considerations concerning Wilkens theory of dislocation line-broadening
Armstrong, NG
;
Leoni, M
;
Scardi, P
2004-01
Determining the dislocation contrast factor for x-ray line profile analysis
Armstrong, NG
;
Lynch, PA
;
Mittemeijer, EJ
;
Scardi, P
2004-01
X-ray diffraction characterisation of nanoparticles size and shape distributions: application to bimodal distributions
Armstrong, NG
;
Kalceff, W
;
Cline, JP
;
Bonevich, JE
;
Lynch, PA
;
Tang, C
;
Thompson, S
;
Savvides, N