| Issue Date | Title | Author(s) |
| 2008-08-15 | A system for supplying constant electrical power for postprocessing tin-doped indium oxide films | Bertinshaw, J; Kirkup, L; Phillips, M; Placido, F |
| 2002-01 | Time dependent behaviour of positive ions in the variable pressure scanning electron microscope | Phillips, M; Morgan, SW; Englebrecht, J; Sewell, T; Witcombe, M |
| 2012-11-19 | Effects of oxygen on electron beam induced deposition of SiO<inf>2</inf> using physisorbed and chemisorbed tetraethoxysilane | Bishop, J; Toth, M; Phillips, M; Lobo, C |
| 2019-07-31 | Surface polarity control in ZnO films deposited by pulsed laser deposition | Luo, CQ; Ling, FCC; Rahman, MA; Phillips, M; Ton-That, C; Liao, C; Shih, K; Lin, J; Tam, HW; Djurišić, AB; Wang, SP |
| 2001-01-01 | Optical emission due to ionic displacements in alkaline earth titanates | Cooper, R; Smith, KL; Colella, M; Vance, ER; Phillips, M |
| 2012-10-03 | Role of activated chemisorption in gas-mediated electron beam induced deposition | Bishop, J; Lobo, CJ; Martin, A; Ford, M; Phillips, M; Toth, M |
| 2006-05-16 | Fe-centers in GaN as candidates for spintronics applications | Mnlguth, E; Hoffmann, A; Phillips, M; Gehlhoff, W |
| 2006-01 | Probing carrier behaviour at the nanoscale in gallium nitride using low voltage cathodoluminescence | Phillips, M; Drouin, D; Pauc, N; Kotula, P; marko, M; Scott, JH; Gauvin, R; Beniac, D; Lucas, G; mcKernan, S; Shields, J |
| 2002-01 | A review of gas-electron interactions imaging and X-ray analysis in variable pressure SEM | Griffin, B; Suvorova, A; Phillips, M; Englebrecht, J; Sewell, T; Witcombe, M |
| 2002-01-01 | Relationship between sample morphology and carrier diffusion length in gan thin films | Godlewski, M; Goldys, EM; Phillips, M; Böttcher, T; Flgge, S; Hommel, D; Czernecki, R; Prystawko, P; Leszczynski, M; Perlin, P; Wisniewski, P; Suski, T; Bockowski, M; Grzegory, I; Porowski, S |
