Browsing by Author Toth, M

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Issue DateTitleAuthor(s)
Dec-2014Advances in gas-mediated electron beam-induced etching and related material processing techniquesToth, M
12-May-2017Ambient Protection of Few-Layer Black Phosphorus via Sequestration of Reactive Oxygen Species.Walia, S; Balendhran, S; Ahmed, T; Singh, M; El-Badawi, C; Brennan, MD; Weerathunge, P; Karim, MN; Rahman, F; Rassell, A; Duckworth, J; Ramanathan, R; Collis, GE; Lobo, CJ; Toth, M; Kotsakidis, JC; Weber, B; Fuhrer, M; Dominguez-Vera, JM; Spencer, MJS; Aharonovich, I; Sriram, S; Bhaskaran, M; Bansal, V
Mar-2017Bright Room-Temperature Single-Photon Emission from Defects in Gallium Nitride.Berhane, AM; Jeong, K-Y; Bodrog, Z; Fiedler, S; Schröder, T; Triviño, NV; Palacios, T; Gali, A; Toth, M; Englund, D; Aharonovich, I
Jan-2013Capsule-free fluid delivery and beam-induced electrodeposition in a scanning electron microscopeRandolph, S; Botman, A; Toth, M
Jan-2003Cathodoluminescence efficiency dependence on excitation density in n-type gallium nitridePhillips, M; Telg, H; Kucheyev, SO; Gelhausen, O; Toth, M
Jan-2001Cathodoluminescnece Depth Profiling of Ion-Implanted GaNKucheyev, SO; Toth, M; Phillips, M; Williams, JS; Jagadish, C; Li, G
Jan-2002Chemical origin of the yellow luminescence in GaNKucheyev, SO; Toth, M; Phillips, M; Williams, JS; Jagadish, C; Li, G
2009Contamination-free imaging by electron induced carbon volatilization in environmental scanning electron microscopyToth, M; Lobo, C; Lysaght, M; Vladar, A; Postek, M
Jan-2012Continuum modeling of electron beam induced processesLobo, C; Toth, M; Utke, I; Moshkalev, SA; Russell, P
14-Jul-2015Continuum models of focused electron beam induced processingToth, M; Lobo, C; Friedli, V; Szkudlarek, A; Utke, I
Nov-2014Cryogenic electron beam induced chemical etching.Martin, AA; Toth, M
16-Dec-2016Defect luminescence in diamond and GaN: Towards single photon emitting devicesBerhane, AM; Choi, S; Kato, H; Makino, T; Mizuochi, N; Yamasaki, S; Toth, M; Aharonovich, I
Jan-1999Depletion Layer Imaging Using A Gaseous Secondary Electron Detector In An Environmental Scanning Electron MicroscopePhillips, M; Toth, M; Drouin, D
Jan-2013Deposition of Highly Porous Nanocrystalline Platinum on Functionalized Substrates Through Fluorine-Induced Decomposition of Pt(PF3)(4) AdsorbatesRandolph, S; Botman, A; Toth, M
Jan-2001Depth-Resolved Cathodoluminescence Microanalysis of Near-Edge Emission in Ill-Nitride Thin FilmsGelhausen, O; Phillips, M; Toth, M
Jan-2013Direct-write 3D Nanolithography At Cryogenic TemperaturesBresin, M; Toth, M; Dunn, K
10-Feb-2014Direct-write electron beam fabrication of optically active diamond nanostructuresToth, M; Martin, AA; Shanley, TW; Aharonovich, I
-Direct-write milling of diamond by a focused oxygen ion beamMartin, AA; Randolph, S; Botman, A; Toth, M; Aharonovich, I
15-Dec-2015Dynamic Pattern Formation in Electron-Beam-Induced Etching.Martin, AA; Bahm, A; Bishop, J; Aharonovich, I; Toth, M
Jan-2013Dynamic surface site activation: A rate limiting process in electron beam induced etchingMartin, AA; Phillips, M; Toth, M