Issue Date | Title | Author(s) |
2005-01 | Bayesian analysis of ceria nanoparticles from line profile data | Armstrong, NG; Dowd, AR; Cline, JP; Kalceff, W; Huang, TC |
2004-01-01 | Bayesian inference of nanoparticle-broadened x-ray line profiles | Armstrong, N; Kalceff, W; Cline, JP; Bonevich, JE |
2004-01 | A Bayesian/Maximum Entropy Method for Certification of a Nanocrystalline-Size NIST Reference Material | Armstrong, NG; Kalceff, W; Cline, JP; Bonevich, JE; Mittemeijer, EJ; Scardi, P |
2008 | Cathodoluminescence microanalysis of diamond nanocrystals in fused silicon dioxide | Stevens-Kalceff, M; Prawer, S; Kalceff, W; Orwa, J; Peng, J; McCallum, J; Jamieson, D |
2007-03-13 | Effect of injection current on the repeatability of laser diode junction voltage-temperature measurements | Kirkup, L; Kalceff, W; McCredie, G |
2007-07-12 | Hydrogen in N-methylacetamide: Positions and dynamics of the hydrogen atoms using neutron scattering | Bordallo, HN; Argyriou, DN; Barthès, M; Kalceff, W; Rols, S; Herwig, KW; Fehr, C; Juranyi, F; Seydel, T |
2007 | Hydrogen in Nmethylacetamide Positions and dynamics of the hydrogen atoms using neutron scattering | Bordallo, H; Argyriou, D; Barthes, M; Kalceff, W; Rols, S; Herwig, K; Fehr, C; Juranyi, F; Seydel, T |
2003-05-07 | Inelastic neutron scattering studies of TbNiAlH<inf>1.4</inf> and UNiAlH<inf>2.0</inf> hydrides | Bordallo, HN; Kolesnikov, AI; Kolomiets, AV; Kalceff, W; Nakotte, H; Eckert, J |
2009-12-21 | Raman and neutron scattering study of partially deuterated l-alanine: Evidence of a solid-solid phase transition | De Souza, JM; Freire, PTC; Argyriou, DN; Stride, JA; Barthès, M; Kalceff, W; Bordallo, HN |
2004-07-01 | Student attitudes to learning business statistics: Comparison of online and traditional methods | Suanpang, P; Petocz, P; Kalceff, W |
2006-05-15 | System for measuring the junction temperature of a light emitting diode immersed in liquid nitrogen | Kirkup, L; Kalceff, W; McCredie, G |
2004-01 | X-ray diffraction characterisation of nanoparticles size and shape distributions: application to bimodal distributions | Armstrong, NG; Kalceff, W; Cline, JP; Bonevich, JE; Lynch, PA; Tang, C; Thompson, S; Savvides, N |
2005-10-01 | X-ray reflectivity study of radio frequency sputtered silicon oxide on silicon | Solina, DM; Cheary, RW; Kalceff, W; McCredie, G |