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Issue DateTitleAuthor(s)
2008-03-07High bandwidth secondary electron detection in variable pressure scanning electron microscopy using a Frisch gridMorgan, SW; Phillips, MR
2006-03-01Apparent band-gap shift in InN films grown by remote-plasma-enhanced CVDChen, PPT; Butcher, KSA; Wintrebert-Fouquet, M; Wuhrer, R; Phillips, MR; Prince, KE; Timmers, H; Shrestha, SK; Usher, BF
2001-09-01Electron beam current loss at the high-vacuum-high-pressure boundary in the environmental scanning electron microscopeDanilatos, GD; Phillips, MR; Nailon, JV
2003-04-01Cathodoluminescence efficiency dependence on excitation density in n-type gallium nitridePhillips, MR; Telg, H; Kucheyev, SO; Gelhausen, O; Toth, M
2013-08-28Dynamic surface site activation: A rate limiting process in electron beam induced etchingMartin, AA; Phillips, MR; Toth, M
2012-09-21Electron beam induced chemical dry etching and imaging in gaseous NH <inf>3</inf> environmentsLobo, CJ; Martin, A; Phillips, MR; Toth, M
2007-02-01Nanostructure fabrication by ultra-high-resolution environmental scanning electron microscopyToth, M; Lobo, CJ; Knowles, WR; Phillips, MR; Postek, MT; Vladár, AE
2003-10-20Low-energy electron-beam irradiation and yellow luminescence in activated Mg-doped GaNGelhausen, O; Klein, HN; Phillips, MR; Goldys, EM
2006-08-01Effects of lithium doping and post-processing on the cathodoluminescence of zinc oxide nanoparticlesMcBean, KE; Phillips, MR; Drouin, D
2008-08-01Multi-detector x-ray mapping and generation of correction factor images for problem solvingWuhrer, R; Moran, K; Phillips, MR
Results 31-40 of 164 (Search time: 0.022 seconds).